The research groups of University of Hyderabad (UoH) and Banaras Hindu University (BHU) lead by Prof. Anil Kumar Chaudhary, ACRHEM (DAE-CoE), School of Physics, University of Hyderabad (UoH) and Dr. Jayeeta Lahiri, Asst. Professor of the Department of Physics at Banaras Hindu University (BHU) (Ex. Asst. Professor in Physics, School of Physics, University of Hyderabad) have jointly investigated the new optical properties and shielding efficiencies of CVD-grown carbon-doped boron nitride films in THz domain using Time Domain THz Spectroscopy between 0.2 to 1.8 THz range (under transmission mode). Their study observed a maximum shielding efficiency of 60 dB for an 8.0 nm thick carbon-doped hBN film.
Electromagnetic interference (EMI) shielding is critical for mitigating EMI, which can disrupt the functionality of sensitive electronic devices, and, in some cases, adversely affect biological tissues. One key example of the problems unmitigated EMI can cause in a medical setting is the cardiac pacemaker. This issue has been of concern since the 1960s, according to the U.S. Food and Drug Administration. Everything from magnetic resonance imaging (MRI) to cell phones may interfere with cardiac pacemakers. Similarly, EMI gaskets are common components in satellites, sensitive communications equipment and various other technologies that might have defense applications. Therefore, use of EMI shielding materials in different E-M frequency spectrum range is essential for preserving device performance, ensuring compliance with regulatory standards, and enhancing equipment reliability. Traditional EMI shielding materials often include metals such as copper and aluminium, along with conductive polymers, silicon and foils. While most shielding approaches primarily rely on reflection, our findings indicate that the carbon-doped hBN film exhibits significant absorption capabilities, underscoring its potential as an effective EMI shielding material for emerging 6G and 7G communication systems of the future.
These films were synthesized by Mr. Nurul Hassan in the Surface Science and Nano Structures Lab of the Department of Physics at BHU and THz lab-based study was carried out by Mr. Chandan Ghorui Senior Scholar (PMRF), UoH, Hyderabad.
This work has been published in the peer-reviewed journal Applied Surface Science. https://doi.org/10.1016/j.apsusc.2024.161307
Mr. Nurul Hassan and co-authors express their sincere gratitude to the DST Inspire Fellowship for its support. They also extend their heartfelt thanks to the Ministry of Education’s Scheme for Transformational and Advanced Research in Sciences (STARS), India, the DRDO, Ministry of Defence, Govt. of India for developing THz experimental facility under ACRHEM (DIA-CoE) Phase-III, University of Hyderabad. Mr. Chandan Ghorui and Professor AKC express their sincere thanks to the Director of DIA CoE, ACRHEM, School of Physics for all types of support.